Data underlying: "Method to traceably determine the refractive index by measuring the angle of minimum deviation"

Datasets of refractive index measurements of fused silica measurements at 405 nm, 436 nm, 546 nm and 579 nm, published in "Method to traceable determine the refractive index by measuring the angle of minimum deviation".This work is part of the project 18HLT01 METVES II and received funding from the EMPIR program co-financed by the Participating States and from the European Union's Horizon 2020 research and innovation program